The Digital Instruments scanning probe microscope is used to perform the full range of atomic force microscopy (AFM) techniques to measure surface topography. It is possible to see features less than 5 nm in size. In addition to tapping and contact modes, more advanced techniques such as fluid imaging, nanoindentation, and heating/cooling can be studied. A supply of tapping mode tips (Veeco, model TESP) along with silicon wafers (5 x 5 mm) are available.
Supporting Documents